DocumentCode
3434473
Title
A testing approach for WSI globally interconnected parallel architectures
Author
Buonanno, Giacomo ; Sciuto, Donatella ; Zanicotti, Fabio
Author_Institution
Dipartimento di Elettronica e Inf., Politecnico di Milano, Italy
fYear
1993
fDate
1993
Firstpage
193
Lastpage
202
Abstract
A testability analysis and a testing approach for interconnection topologies are presented. The testing approach is based on the analysis of controllability and observability of the architecture, given the cells functions and the interconnection topology. For the architectures directly derived from a data flow graph, a functional fault model is adopted. A specific fault model is derived for multistage interconnection networks. The switching matrices can be in a number of different states, depending on the number of input/output lines. In general, only a small number of states is necessary for correct computation, and these are the only states considered legal. A cell is defined to be faulty if its switching matrix can reach a nonlegal state.
Keywords
VLSI; integrated circuit testing; microprocessor chips; multiprocessor interconnection networks; parallel architectures; performance evaluation; WSI globally interconnected parallel architectures; controllability; data flow graph; functional fault model; interconnection topologies; multistage interconnection networks; observability; switching matrix; testability analysis; Computer architecture; Controllability; Data flow computing; Flow graphs; Multiprocessor interconnection networks; Network topology; Observability; Parallel architectures; Performance analysis; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Wafer Scale Integration, 1993. Proceedings., Fifth Annual IEEE International Conference on
Conference_Location
San Francisco, CA, USA
Print_ISBN
0-7803-0867-0
Type
conf
DOI
10.1109/ICWSI.1993.255259
Filename
255259
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