• DocumentCode
    3434697
  • Title

    Comparative study of phase and amplitude noise of CE, CE-CB and CC-CB bipolar transistor amplifiers

  • Author

    Boldyreva, T.I.

  • Author_Institution
    Moscow Power Eng. Inst., Russia
  • fYear
    1998
  • fDate
    27-29 May 1998
  • Firstpage
    218
  • Lastpage
    225
  • Abstract
    Results of development of an algorithm for theoretical calculations both wideband and 1/f PM and AM noise in common emitter (CE), common emitter-common base (CE-CB) and common collector-common base (CC-CB) amplifiers are presented. The algorithm is based on using hybrid pi model of a bipolar junction transistor (BJT). An influence of wideband noise sources is calculated basing on well known noise model of a BJT. An influence of 1/f noise sources is calculated using a model with fluctuating recombination conductance presented in the paper. Using the algorithm and results of measurements of 1/f current noise of BJT, power spectral densities of wideband and 1/f PM and AM noise of CE, CE-CB and CC-CB amplifiers with complex emitter impedance ZE were calculated. Basing on these calculations a comparison of CE, CE-CB and CC-CB amplifiers is presented. The values that are compared are power spectral densities of PM and AM noise. The opportunities of 1/f PM noise compression by specially selected parameters of emitter impedances are investigated. Some recommendations for design of low PM and AM noise amplifiers are presented
  • Keywords
    1/f noise; amplifiers; amplitude modulation; bipolar transistor circuits; circuit analysis computing; circuit noise; phase modulation; phase noise; 1/f PM and AM noise; AM noise; amplitude noise; bipolar junction transistor; common collector-common base amplifiers; common emitter amplifiers; common emitter-common base amplifiers; complex emitter impedance; fluctuating recombination conductance; hybrid pi model; phase noise; power spectral densities; wideband noise; wideband noise sources; Broadband amplifiers; Current measurement; Density measurement; Hybrid junctions; Impedance measurement; Noise level; Noise measurement; Phase noise; Power measurement; Wideband;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium, 1998. Proceedings of the 1998 IEEE International
  • Conference_Location
    Pasadena, CA
  • ISSN
    1075-6787
  • Print_ISBN
    0-7803-4373-5
  • Type

    conf

  • DOI
    10.1109/FREQ.1998.717908
  • Filename
    717908