DocumentCode :
3434697
Title :
Comparative study of phase and amplitude noise of CE, CE-CB and CC-CB bipolar transistor amplifiers
Author :
Boldyreva, T.I.
Author_Institution :
Moscow Power Eng. Inst., Russia
fYear :
1998
fDate :
27-29 May 1998
Firstpage :
218
Lastpage :
225
Abstract :
Results of development of an algorithm for theoretical calculations both wideband and 1/f PM and AM noise in common emitter (CE), common emitter-common base (CE-CB) and common collector-common base (CC-CB) amplifiers are presented. The algorithm is based on using hybrid pi model of a bipolar junction transistor (BJT). An influence of wideband noise sources is calculated basing on well known noise model of a BJT. An influence of 1/f noise sources is calculated using a model with fluctuating recombination conductance presented in the paper. Using the algorithm and results of measurements of 1/f current noise of BJT, power spectral densities of wideband and 1/f PM and AM noise of CE, CE-CB and CC-CB amplifiers with complex emitter impedance ZE were calculated. Basing on these calculations a comparison of CE, CE-CB and CC-CB amplifiers is presented. The values that are compared are power spectral densities of PM and AM noise. The opportunities of 1/f PM noise compression by specially selected parameters of emitter impedances are investigated. Some recommendations for design of low PM and AM noise amplifiers are presented
Keywords :
1/f noise; amplifiers; amplitude modulation; bipolar transistor circuits; circuit analysis computing; circuit noise; phase modulation; phase noise; 1/f PM and AM noise; AM noise; amplitude noise; bipolar junction transistor; common collector-common base amplifiers; common emitter amplifiers; common emitter-common base amplifiers; complex emitter impedance; fluctuating recombination conductance; hybrid pi model; phase noise; power spectral densities; wideband noise; wideband noise sources; Broadband amplifiers; Current measurement; Density measurement; Hybrid junctions; Impedance measurement; Noise level; Noise measurement; Phase noise; Power measurement; Wideband;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium, 1998. Proceedings of the 1998 IEEE International
Conference_Location :
Pasadena, CA
ISSN :
1075-6787
Print_ISBN :
0-7803-4373-5
Type :
conf
DOI :
10.1109/FREQ.1998.717908
Filename :
717908
Link To Document :
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