• DocumentCode
    3434707
  • Title

    An AFM study on the degradation of phase-change recordable compact disc

  • Author

    Ng, W.M.C. ; Ho, H.P.

  • Author_Institution
    Dept. of Phys. & Mater. Sci., City Univ. of Hong Kong, Kowloon, China
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    116
  • Lastpage
    121
  • Abstract
    An AFM study on the degradation in phase-change recordable compact discs is presented. The results indicate that degradation is primarily due to the formation of bubbles within the phase-change layer, which may act as light scattering centers. Doping of nitrogen in the dielectric layers or using higher track speed can slow down the formation of bubbles. We also present a new technique for enhancing the topological contrast of the phase change marks by electroplating the phase-change layer with nickel
  • Keywords
    atomic force microscopy; audio discs; bubbles; doping profiles; electroplating; light scattering; optical disc storage; reliability; surface topography; AFM; CD degradation; Ni; Ni electroplating; bubble formation; dielectric layers; light scattering centers; nitrogen doping; phase change marks; phase-change layer; phase-change recordable compact disc; topological contrast; track speed; Amorphous materials; Atomic force microscopy; Conductivity; Crystallization; Degradation; Performance evaluation; Scanning electron microscopy; Surface topography; Testing; Transmission electron microscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 2001. Proceedings. 2001 IEEE Hong Kong
  • Conference_Location
    Hong Kong
  • Print_ISBN
    0-7803-6714-6
  • Type

    conf

  • DOI
    10.1109/HKEDM.2001.946931
  • Filename
    946931