Proceedings European Design and Test Conference. ED & TC 97

The following topics were dealt with: system analysis techniques and applications; sequential ATPG; design and design methodology for analog circuits; built-in self-test; synthesis of controllers; microsystems design; software generation for embedded processors; register transfer level test synthesis; BDD´s and formal verification; high performance architectures for multimedia and communication ASICs; I_DDQ test technology; architecture exploration; layout design; testability solutions for regular structures; data converter testing; discrete event simulation; analog design and layout tools; power modelling and estimation; formal methods in synthesis and verification; concurrent checking; scheduling; system level design; diagnosis and test generation; logic synthesis for low power; testability at different abstraction levels; hardware and software tools for analog and mixed-signal test.