• DocumentCode
    34350
  • Title

    Sub 0.5 V Operation of Performance Driven Mobile Systems Based on Area Scaled Tunnel FET Devices

  • Author

    Rajoriya, Anukool ; Shrivastava, Mayank ; Gossner, Harald ; Schulz, T. ; Rao, Valipe Ramgopal

  • Author_Institution
    Dept. of Electr. Eng., Indian Inst. of Technol. Bombay, Mumbai, India
  • Volume
    60
  • Issue
    8
  • fYear
    2013
  • fDate
    Aug. 2013
  • Firstpage
    2626
  • Lastpage
    2633
  • Abstract
    Advanced mobile applications demand low power and high performance systems. In this paper, a technology computer aided design (TCAD)-based feasibility investigation of a recently proposed area tunneling field effect transistor (FET) structure is carried out from the point of high volume and ultralow power mobile applications. We demonstrate that for realization of future ultralow power and high performance systems, unique properties of area tunneling class of tunnel FET structures need to be employed. These devices are realized by engineering the tunneling region profile and tunneling cross-sectional area. The optimized devices are found to leverage up to ~ 7× energy reduction when compared with the 20-nm node MOS device options while meeting the high performance targets. Device design insights for such an area tunneling class of tunnel FET structures are discussed in this paper for the first time. It is shown that by lowering the supply voltage below 0.5 V, up to 10× reduction of the energy delay product is feasible by using area tunneling devices.
  • Keywords
    MOSFET; technology CAD (electronics); MOS device; TCAD-based feasibility investigation; advanced mobile applications; area scaled tunnel FET devices; energy reduction; high volume mobile applications; performance driven mobile systems; technology computer aided design-based feasibility investigation; tunneling cross-sectional area; tunneling field effect transistor devices; tunneling region profile; ultralow power mobile applications; voltage 0.5 V; Delays; Logic gates; MOSFET; Performance evaluation; Silicon germanium; Tunneling; Area tunneling field effect transistor (FET); SOC; energy minimization; line tunneling FET and TFET; low voltage operation; tunnel field effect transistor;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2013.2270566
  • Filename
    6557508