DocumentCode
34350
Title
Sub 0.5 V Operation of Performance Driven Mobile Systems Based on Area Scaled Tunnel FET Devices
Author
Rajoriya, Anukool ; Shrivastava, Mayank ; Gossner, Harald ; Schulz, T. ; Rao, Valipe Ramgopal
Author_Institution
Dept. of Electr. Eng., Indian Inst. of Technol. Bombay, Mumbai, India
Volume
60
Issue
8
fYear
2013
fDate
Aug. 2013
Firstpage
2626
Lastpage
2633
Abstract
Advanced mobile applications demand low power and high performance systems. In this paper, a technology computer aided design (TCAD)-based feasibility investigation of a recently proposed area tunneling field effect transistor (FET) structure is carried out from the point of high volume and ultralow power mobile applications. We demonstrate that for realization of future ultralow power and high performance systems, unique properties of area tunneling class of tunnel FET structures need to be employed. These devices are realized by engineering the tunneling region profile and tunneling cross-sectional area. The optimized devices are found to leverage up to ~ 7× energy reduction when compared with the 20-nm node MOS device options while meeting the high performance targets. Device design insights for such an area tunneling class of tunnel FET structures are discussed in this paper for the first time. It is shown that by lowering the supply voltage below 0.5 V, up to 10× reduction of the energy delay product is feasible by using area tunneling devices.
Keywords
MOSFET; technology CAD (electronics); MOS device; TCAD-based feasibility investigation; advanced mobile applications; area scaled tunnel FET devices; energy reduction; high volume mobile applications; performance driven mobile systems; technology computer aided design-based feasibility investigation; tunneling cross-sectional area; tunneling field effect transistor devices; tunneling region profile; ultralow power mobile applications; voltage 0.5 V; Delays; Logic gates; MOSFET; Performance evaluation; Silicon germanium; Tunneling; Area tunneling field effect transistor (FET); SOC; energy minimization; line tunneling FET and TFET; low voltage operation; tunnel field effect transistor;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2013.2270566
Filename
6557508
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