DocumentCode
3435176
Title
A composite high-voltage device using low-voltage SOI MOSFETs
Author
Valeri, Stephen J. ; Robinson, Andrew L.
Author_Institution
Center for Integrated Sensors & Circuits, Michigan Univ., Ann Arbor, MI, USA
fYear
1990
fDate
2-4 Oct 1990
Firstpage
169
Lastpage
170
Abstract
A circuit is described that uses low-voltage transistors to form a high-voltage composite device. The circuit is a series string of SOI (silicon-on-insulator) MOSFETs and associated biasing elements fabricated using a modified nMOS process on a SIMOX (separation by implantation of oxygen) substrate. The circuit voltages higher than the breakdown voltage of a single transistor by dividing the applied voltage among the transistors in the string. MOSFET-like characteristics with breakdown voltage up to 60 V are demonstrated using a string of 25 SOI MOSFETs, each with a breakdown voltage of 6-7 V
Keywords
MOS integrated circuits; power integrated circuits; 6 to 7 V; 60 V; SIMOX; biasing elements; breakdown voltage; composite high-voltage device; low-voltage SOI MOSFETs; low-voltage transistors; modified nMOS process; string of MOSFETs; Breakdown voltage; Circuits; Current-voltage characteristics; MOS devices; MOSFETs; Resistors; Substrates; Switches; Thin film transistors; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
SOS/SOI Technology Conference, 1990., 1990 IEEE
Conference_Location
Key West, FL
Print_ISBN
0-87942-573-3
Type
conf
DOI
10.1109/SOSSOI.1990.145766
Filename
145766
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