• DocumentCode
    3435176
  • Title

    A composite high-voltage device using low-voltage SOI MOSFETs

  • Author

    Valeri, Stephen J. ; Robinson, Andrew L.

  • Author_Institution
    Center for Integrated Sensors & Circuits, Michigan Univ., Ann Arbor, MI, USA
  • fYear
    1990
  • fDate
    2-4 Oct 1990
  • Firstpage
    169
  • Lastpage
    170
  • Abstract
    A circuit is described that uses low-voltage transistors to form a high-voltage composite device. The circuit is a series string of SOI (silicon-on-insulator) MOSFETs and associated biasing elements fabricated using a modified nMOS process on a SIMOX (separation by implantation of oxygen) substrate. The circuit voltages higher than the breakdown voltage of a single transistor by dividing the applied voltage among the transistors in the string. MOSFET-like characteristics with breakdown voltage up to 60 V are demonstrated using a string of 25 SOI MOSFETs, each with a breakdown voltage of 6-7 V
  • Keywords
    MOS integrated circuits; power integrated circuits; 6 to 7 V; 60 V; SIMOX; biasing elements; breakdown voltage; composite high-voltage device; low-voltage SOI MOSFETs; low-voltage transistors; modified nMOS process; string of MOSFETs; Breakdown voltage; Circuits; Current-voltage characteristics; MOS devices; MOSFETs; Resistors; Substrates; Switches; Thin film transistors; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SOS/SOI Technology Conference, 1990., 1990 IEEE
  • Conference_Location
    Key West, FL
  • Print_ISBN
    0-87942-573-3
  • Type

    conf

  • DOI
    10.1109/SOSSOI.1990.145766
  • Filename
    145766