DocumentCode

3435651

Title

Building yield into systems-on chips for nanometer technologies

Author

Magarshack, Philippe

Author_Institution

STMicroelectronics

fYear

2003

fDate

27 April-1 May 2003

Firstpage

4

Lastpage

4

Keywords

System testing; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Test Symposium, 2003. Proceedings. 21st

ISSN

1093-0167

Print_ISBN

0-7695-1924-5

Type

conf

DOI

10.1109/VTEST.2003.1197624

Filename

1197624