A production-oriented measurement method for fast and exhaustive Iddq tests

The paper describes a measurement method to perform an iddq test on each vector of a test pattern. The measurement is performed using the functional test mode of a digital tester. Vector rates between 100 KHz and 10 MHz yield a current resolution of 10 uA to 100 uA. The great advantage of the method is that the measurements are performed by using only the tester´s pin electronic and the existing control software. No additional equipment is neccessary and the setup of the loadboard is made without any additional components except a buffering capacitance for the device, if needed. The application of the method to the iddq test of an 8 bit microcontroller is described