DocumentCode
3435848
Title
DG summary: BEOL discussion
Author
Lloyd, James ; McGowan, Brian
Author_Institution
SUNY Albany CNSE
fYear
2012
fDate
14-18 Oct. 2012
Firstpage
221
Lastpage
221
Abstract
The DG on back-end of the line reliability took place on the evening of Oct. 17, 2012, with attendees ready to discuss challenges in the BEOL field.
fLanguage
English
Publisher
ieee
Conference_Titel
Integrated Reliability Workshop Final Report (IRW), 2012 IEEE International
Conference_Location
South Lake Tahoe, CA, USA
ISSN
1930-8841
Print_ISBN
978-1-4673-2749-7
Type
conf
DOI
10.1109/IIRW.2012.6468966
Filename
6468966
Link To Document