• DocumentCode
    3435887
  • Title

    Decision diagrams method for k-out-of-n: G systems

  • Author

    Shu-Min Li ; Shu-Bin Si ; Shuai Zhang ; Hong-Yan Dui

  • Author_Institution
    Sch. of Mechantronics, Northwestern Polytech. Univ., Xi´an, China
  • fYear
    2013
  • fDate
    15-18 July 2013
  • Firstpage
    263
  • Lastpage
    267
  • Abstract
    Binary k-out-of-n system is a commonly used reliability model in engineering practice. Many researches have extended the concept of k-out-of-n system to multi-state k-out-of-n systems. This paper proposes a binary decision diagram (BDD) based approach for binary k-out-of-n system: G system and a multi-state multi-valued decision diagram (MMDD) based approach for multi-state k-out-of-n: G system. BDD and MMDD have been extensively used for representing and manipulating logic functions in many areas, including reliability modeling and analysis. In this paper, patterns of BDD/MMDD for binary/multi-state k-out-of-n: G system are summarized and proved, and a two-step algorithmic process is proposed for modeling BDD/MMDD, a case is implemented to demonstrate the performance of the presented method.
  • Keywords
    binary decision diagrams; reliability theory; G system; MMDD based approach; binary decision diagram; binary k-out-of-n system; logic function manipulation; logic function representation; multistate k-out-of-n system; multistate multivalued decision diagram; reliability model; two-step algorithmic process; Algorithm design and analysis; Boolean functions; Data structures; Indexes; Reliability engineering; Safety; G systems; binary decision diagrams; k-out-of-n; multi-state multi-valued decision diagram;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE), 2013 International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4799-1014-4
  • Type

    conf

  • DOI
    10.1109/QR2MSE.2013.6625580
  • Filename
    6625580