Title :
DG summary: Product/circuit reliability discussion
Author :
Bansal, Aditya ; Wu, James
Abstract :
The DG on product/circuit reliability took place on the evening of Oct. 17, 2012. The moderator welcomed about twenty or so attendees to share their thoughts and experiences relevant to this topic.
Conference_Titel :
Integrated Reliability Workshop Final Report (IRW), 2012 IEEE International
Conference_Location :
South Lake Tahoe, CA, USA
Print_ISBN :
978-1-4673-2749-7
DOI :
10.1109/IIRW.2012.6468968
