Precise dielectric properties determination of laminar-shaped materials in a partially-filled waveguide

Author

Catala-Civera, J.M. ; Penaranda-Foix, Felipe ; Sanchez-Hernandez, D. ; de los Reyes, E.

Author_Institution

Dept. de Comunicaciones, Univ. Politecnica de Valencia, Spain

Volume

3

fYear

1999

fDate

11-16 July 1999

Firstpage

1942

Abstract

An enhanced technique for complex dielectric properties characterization of laminar-shaped materials is presented. The technique is based upon scattering measurements of a partially-filled rectangular waveguide. The influence of the different parameters regarding the achievable accuracy have also been analyzed in order to determine the optimum sample configuration. Measurements of some commercial dielectric substrates used for printed antenna design were performed and have been used for validation purposes.

Keywords

S-parameters; dielectric loss measurement; dielectric properties; dielectric-loaded waveguides; measurement errors; microstrip antennas; permittivity measurement; rectangular waveguides; waveguide theory; accuracy; commercial dielectric substrates; complex dielectric properties; complex permittivity; dielectric constant; dielectric loss factor; laminar-shaped materials; measurement error; optimum sample configuration; partially-filled rectangular waveguide; partially-filled waveguide; printed antenna design; propagation constant; scattering measurements; Antenna measurements; Dielectric materials; Dielectric measurements; Dielectric substrates; Electromagnetic waveguides; Equations; Permittivity measurement; Propagation constant; Rectangular waveguides; Waveguide components;

fLanguage

English

Publisher

ieee

Conference_Titel

Antennas and Propagation Society International Symposium, 1999. IEEE

Conference_Location

Orlando, FL, USA

Print_ISBN

0-7803-5639-x

Type

conf

DOI

10.1109/APS.1999.788338

Filename

788338