DocumentCode
3436336
Title
Improved diagnosis of realistic interconnect shorts
Author
de Sousa, J.T. ; Cheung, P.Y.K.
Author_Institution
Dept. of Electr. & Electron. Eng., Imperial Coll. of Sci., Technol. & Med., London, UK
fYear
1997
fDate
17-20 Mar 1997
Firstpage
501
Lastpage
505
Abstract
Original diagnostic schemes for wire interconnect shorts are proposed. The idea is to use layout extracted realistic shorts and a broader range of short behaviour assumptions to derive the schemes. Results on real examples clearly show the superiority of the new schemes, both in terms of test size and diagnostic resolution
Keywords
circuit testing; fault diagnosis; diagnosis; layout extraction; testing; wire interconnect short; Circuit faults; Circuit testing; Controllability; Educational institutions; Electronic components; Electronic equipment testing; Integrated circuit interconnections; Observability; Printed circuits; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
European Design and Test Conference, 1997. ED&TC 97. Proceedings
Conference_Location
Paris
ISSN
1066-1409
Print_ISBN
0-8186-7786-4
Type
conf
DOI
10.1109/EDTC.1997.582407
Filename
582407
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