Title :
Improved diagnosis of realistic interconnect shorts
Author :
de Sousa, J.T. ; Cheung, P.Y.K.
Author_Institution :
Dept. of Electr. & Electron. Eng., Imperial Coll. of Sci., Technol. & Med., London, UK
Abstract :
Original diagnostic schemes for wire interconnect shorts are proposed. The idea is to use layout extracted realistic shorts and a broader range of short behaviour assumptions to derive the schemes. Results on real examples clearly show the superiority of the new schemes, both in terms of test size and diagnostic resolution
Keywords :
circuit testing; fault diagnosis; diagnosis; layout extraction; testing; wire interconnect short; Circuit faults; Circuit testing; Controllability; Educational institutions; Electronic components; Electronic equipment testing; Integrated circuit interconnections; Observability; Printed circuits; Wire;
Conference_Titel :
European Design and Test Conference, 1997. ED&TC 97. Proceedings
Conference_Location :
Paris
Print_ISBN :
0-8186-7786-4
DOI :
10.1109/EDTC.1997.582407
