Title :
Design for consecutive transparency of cores in system-on-a-chip
Author :
Yoneda, Tomokazu ; Fujiwara, Hideo
Author_Institution :
Graduate Sch. of Inf. Sci., Nara Inst. of Sci. & Technol., Japan
fDate :
27 April-1 May 2003
Abstract :
This paper presents a design-for-consecutive-transparency method that makes a soft core (RTL description) consecutively transparent using integer linear programming. Consecutive transparency of a core guarantees consecutive propagation of arbitrary test/response sequences from the core inputs to the core outputs with some latency. Therefore, it is possible to apply/observe arbitrary test/response sequences to/from an embedded core consecutively at the speed of the system clock by using interconnects and consecutively transparent cores in an SoC. Experimental results show that the proposed method introduces a lower area overhead compared to the bypass method that adds direct paths from PIs to POs with multiplexers.
Keywords :
design for testability; integer programming; integrated circuit design; integrated circuit interconnections; integrated circuit technology; linear programming; logic design; logic testing; system-on-chip; DFCT method; DFT; RTL description core; SoC interconnects; arbitrary test response sequence latency; area overhead reduction; consecutive testability; consecutively transparent cores; core inputs; core outputs; design for consecutive transparency; design for testability; design-for-testability; embedded core; integer linear programming; register transfer level; soft core; system clock speed testing; system-on-a-chip cores; test access mechanism; Circuit faults; Circuit testing; Clocks; Delay; Design for testability; Integrated circuit testing; Multiplexing; Sequential analysis; System testing; System-on-a-chip;
Conference_Titel :
VLSI Test Symposium, 2003. Proceedings. 21st
Print_ISBN :
0-7695-1924-5
DOI :
10.1109/VTEST.2003.1197665