Title :
Compact structural test generation for analog macros
Author :
Kaal, Victor ; Kerkhoff, Hans
Author_Institution :
MESA Res. Inst., Twente Univ., Enschede, Netherlands
Abstract :
A structural, fault-model based methodology for the generation of compact high-quality test sets for analog macros is presented. Results are shown for an IV-converter macro design. Parameters of so-called test configurations are optimized for detection of faults in a fault-list and an optimal selection algorithm results in determining the best test set. The distribution of the results along the parameter-axes of the test configurations is investigated to identify a collapsed high-quality test set
Keywords :
automatic testing; fault diagnosis; integrated circuit testing; mixed analogue-digital integrated circuits; IV-converter macro design; analog macros; automatic testing; collapsed high-quality test set; compact structural test generation; fault-model based methodology; mixed-signal ICs; optimal selection algorithm; parameter-axes; test configurations; Analog integrated circuits; Automatic testing; Circuit faults; Circuit testing; Dictionaries; Digital integrated circuits; Electronic mail; Fault detection; Integrated circuit testing; Time to market;
Conference_Titel :
European Design and Test Conference, 1997. ED&TC 97. Proceedings
Conference_Location :
Paris
Print_ISBN :
0-8186-7786-4
DOI :
10.1109/EDTC.1997.582420
