DocumentCode :
3436779
Title :
Notice of Retraction
Robust layout design of pin-hole locators in lampshade assembly process
Author :
Zejun Wen ; Fan Zhang
Author_Institution :
Hunan Provincial Key Lab. of Health Maintenance for Mech. Equip., Hunan Univ. of Sci. & Technol., Xiangtan, China
fYear :
2013
fDate :
15-18 July 2013
Firstpage :
455
Lastpage :
459
Abstract :
Notice of Retraction

After careful and considered review of the content of this paper by a duly constituted expert committee, this paper has been found to be in violation of IEEE´s Publication Principles.

We hereby retract the content of this paper. Reasonable effort should be made to remove all past references to this paper.

The presenting author of this paper has the option to appeal this decision by contacting TPII@ieee.org.

Robust layout design of pin-hole locators in head lampshade assembly process is presented based on Taguchi orthogonal experiment and 3DCS. Firstly, based on the 3-2-1 locator principle of three dimensional assembly process, the influence of pin-hole locators design parameters on the variation of assembly part is analyzed and the pin-hole locators design parameters level of head lampshade is determined. Then, Taguchi orthogonal experiment is arranged considering the pin-hole locator coordinates of head lampshade as design parameters and locating variation as noise parameters. A robustness evaluation function of assembly quality is proposed considering the assembly clearance between turn light and headlight as evaluation index. Following, the SNR calculation method of robust layout design for pin-hole locators is proposed. Finally, 3DCS is used to analyze the robustness of assembly quality with variation parameters under pin-hole locator schemes. The results show that, compared with Taguchi original design scheme, the mean value of measure point in robust design scheme is decreased by 22.48%.
Keywords :
Taguchi methods; assembling; automobile industry; automobile manufacture; automotive components; automotive engineering; lamps; 3D assembly process; 3DCS; SNR calculation method; Taguchi original design scheme; Taguchi orthogonal experiment; assembly clearance; assembly part; assembly quality; evaluation index; head lampshade assembly process; headlight; noise parameters; pin hole locator coordinates; pin hole locators design; robust design scheme; robust layout design; robustness evaluation function; Assembly; Layout; Robustness; Signal to noise ratio; Turning; 3DCS; orthogonal experiment; pin-hole locators layout; robust design;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE), 2013 International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4799-1014-4
Type :
conf
DOI :
10.1109/QR2MSE.2013.6625622
Filename :
6625622
Link To Document :
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