DocumentCode :
3436812
Title :
Efficient implication-based untestable bridge fault identifier
Author :
Syal, Manan ; Hsiao, Michael S. ; Doreswamy, Kiran B. ; Chakravarty, Sreejit
Author_Institution :
Bradley Dept. of Electr. & Comput. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
fYear :
2003
fDate :
27 April-1 May 2003
Firstpage :
393
Lastpage :
398
Abstract :
This paper presents a novel, low cost technique based on implications to identify untestable bridging faults in sequential circuits. Sequential symbolic simulation is first performed, as a preprocessing step, to identify nets which are uncontrollable to a specific logic value. Then, an implication-based analysis is carried out for each fault to determine if a particular fault is testable or not. We also use information about the untestable stuck-at faults to filter out some bridges early in the analysis process. The application of our technique to ISCAS ´89 sequential benchmark circuits and a few industrial circuits showed that a large number of untestable bridges could be identified at a low cost, both in terms of memory and execution time.
Keywords :
fault diagnosis; logic simulation; logic testing; sequential circuits; symbol manipulation; ISCAS ´89 benchmark circuits; cost; execution time; implication-based untestable bridge fault identifier; industrial circuits; preprocessing; sequential circuits; symbolic simulation; untestable stuck-at faults; Bridge circuits; Circuit faults; Circuit simulation; Circuit testing; Costs; Fault diagnosis; Information filtering; Information filters; Logic; Sequential circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 2003. Proceedings. 21st
ISSN :
1093-0167
Print_ISBN :
0-7695-1924-5
Type :
conf
DOI :
10.1109/VTEST.2003.1197680
Filename :
1197680
Link To Document :
بازگشت