DocumentCode :
3436895
Title :
Author index
fYear :
2003
fDate :
1-1 May 2003
Firstpage :
431
Lastpage :
432
Abstract :
The author index contains an entry for each author and coauthor included in the proceedings record.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 2003. Proceedings. 21st
Conference_Location :
Napa, CA, USA
ISSN :
1093-0167
Print_ISBN :
0-7695-1924-5
Type :
conf
DOI :
10.1109/VTEST.2003.1197684
Filename :
1197684
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3436895
