DocumentCode
3436964
Title
March LA: a test for linked memory faults
Author
van de Goor, A.J. ; Gaydadjiev, G.N. ; Yarmolik, V.N. ; Mikitjuk, V.G.
Author_Institution
Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands
fYear
1997
fDate
17-20 Mar 1997
Firstpage
627
Abstract
This paper introduces a test which can detect all simple faults as well as all linked faults, involving an arbitrary number of simple faults
Keywords
fault diagnosis; integrated circuit testing; integrated memory circuits; March LA; linked fault; memory testing; simple fault; Electrical fault detection; Fault detection; Informatics; Information technology; Sociotechnical systems; Software testing;
fLanguage
English
Publisher
ieee
Conference_Titel
European Design and Test Conference, 1997. ED&TC 97. Proceedings
Conference_Location
Paris
ISSN
1066-1409
Print_ISBN
0-8186-7786-4
Type
conf
DOI
10.1109/EDTC.1997.582440
Filename
582440
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