DocumentCode :
3436986
Title :
Autotestcons of the future
fYear :
2005
fDate :
26-29 Sept. 2005
Abstract :
Provides a listing of upcoming conference events of interest to practitioners and researchers.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Autotestcon, 2005. IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-9101-2
Type :
conf
DOI :
10.1109/AUTEST.2005.1609077
Filename :
1609077
Link To Document :
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