DocumentCode
3437161
Title
Formal Methods for Pattern Based Reliability Analysis in Embedded Systems
Author
Ghosh, S. ; Dasgupta, P.
Author_Institution
Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kharagpur, Kharagpur, India
fYear
2015
fDate
3-7 Jan. 2015
Firstpage
192
Lastpage
197
Abstract
A wide variety of periodic tasks in embedded systems require reliable service guarantees under a given fault distribution. Reliable execution requires the periodic task to be replicated more often under normal circumstances so that the desired service throughput is achieved under the fault distribution. This paper presents a formal approach for verifying whether an input distribution meets the desired service guarantee under a fault distribution, where all the distributions are specified in real time calculus. The proposed methodology leverages the recently discovered relationship between real time calculus specifications and omega-regular languages.
Keywords
embedded systems; fault tolerant computing; formal verification; software reliability; temporal logic; embedded systems; fault distribution; formal methods; formal verification; omega-regular languages; pattern based reliability analysis; periodic tasks; real time calculus specifications; reliable execution; reliable service guarantees; service throughput; Automata; Computer network reliability; Embedded systems; Model checking; Reliability engineering; Throughput;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design (VLSID), 2015 28th International Conference on
Conference_Location
Bangalore
ISSN
1063-9667
Type
conf
DOI
10.1109/VLSID.2015.38
Filename
7031731
Link To Document