Title :
A method for topology conformance tests under logical constraints
Author :
Zhang, Jianwu ; Xu, Guoai ; Yang, Yixian ; Guo, Shize
Author_Institution :
Nat. Eng. Lab. for Disaster Backup & Recovery, Beijing Univ. of Posts & Telecommun., Beijing, China
Abstract :
Common Criteria(CC) provides only the standard for evaluating information security product or system. Conformance test is considered from a statistical point of view, while the determination of whether the topology is consistent with the standard depends on a conformance test. CC based topology conformance test is in trouble without an effective method. In this paper, a method for topology conformance test was presented and an algorithm for topology conformance test under logical constraints was introduced. In our method, the topology is described by a matrix and the logical constraints are stored using Binary Decision Diagrams (BDDs) data structure. From the experimental results, we can see the method is efficient enough for topology conformance test.
Keywords :
Boolean functions; Circuit testing; Data structures; Electronic mail; Information security; Laboratories; Logic testing; Protection; System testing; Telecommunication network topology; logical constrants; topology; topology conformance;
Conference_Titel :
Wireless Communications, Networking and Information Security (WCNIS), 2010 IEEE International Conference on
Conference_Location :
Beijing, China
Print_ISBN :
978-1-4244-5850-9
DOI :
10.1109/WCINS.2010.5541805