• DocumentCode
    3437259
  • Title

    Introduction to the next generation automatic test system (NGATS)

  • Author

    Burden, Judy ; Curry, Patrick A. ; Roby, Derec ; Love, Frances

  • Author_Institution
    Anal. Services, Inc., Huntsville, AL, USA
  • fYear
    2005
  • fDate
    26-29 Sept. 2005
  • Firstpage
    16
  • Lastpage
    19
  • Abstract
    The next generation automatic test system (NGATS) is the latest addition to the integrated family of test equipment (IFTE), developed and managed by product manager, test, measurement and diagnostic equipment (PM TMDE). The NGATS, commonly known as the base shop test facility (V)6, joins the other BSTFs developed by the off platform, automatic test system program. NGATS is a highly mobile, rapidly deployable, general-purpose, reconfigurable automatic test system. The system is designed to support the testing and screening of all army weapon systems to maintain their readiness to shoot, move and communicate. Benefits of the NGATS include helping facilitate the standardization of army automatic test equipment, increasing weapon system availability and facilitating MOS consolidation. Additionally, it reduces repair parts inventory, increases mobility, deployability, affordability and supportability, reduces footprint of automated test equipment and screens for no evidence of failure (NEOF). NGATS assures compliance with joint NxTest architecture. NGATS will support the agile rapid global combat support (ARGCS) advanced concept technology demonstration (ACTD) by using a common framework for DoD automatic test systems (ATS). Spiral development of this system will ultimately modernize and replace three existing systems, direct support electronic systems test set (DSESTS), BSTF (V)3, and BSTF (V)5. The NGATS will not only support legacy systems but will also support new systems.
  • Keywords
    automatic test equipment; automatic testing; weapons; ACTD; ARGCS; BSTFs; DSESTS; IFTE; MOS consolidation; NEOF; NGATS; PM TMDE; advanced concept technology demonstration; agile rapid global combat support; army weapon systems; automated test equipment; automatic test system program; base shop test facility; direct support electronic systems test set; integrated family of test equipment; next generation automatic test system; no evidence of failure; product manager test measurement and diagnostic equipment; Automatic test equipment; Automatic testing; Circuit faults; Drives; Electronic equipment testing; System testing; Test equipment; Test facilities; Vehicles; Weapons;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Autotestcon, 2005. IEEE
  • Print_ISBN
    0-7803-9101-2
  • Type

    conf

  • DOI
    10.1109/AUTEST.2005.1609092
  • Filename
    1609092