DocumentCode :
343732
Title :
Observations of MMW backscatter from snow near grazing incidence
Author :
De Roo, R.D. ; Yang Du ; Ulaby, F.T.
Author_Institution :
Radiation Lab., Michigan Univ., Ann Arbor, MI, USA
Volume :
1
fYear :
1999
fDate :
11-16 July 1999
Firstpage :
44
Abstract :
In the winter of 1998 and 1999 the University of Michigan made numerous polarimetric backscatter measurements of snow at 35 and 95 GHz at depression angles between 2/spl deg/ and 14/spl deg/. This is the first known measurement of the backscatter from snow at these frequencies and angles that are accompanied by extensive ground truth including snow depth, air temperature, snow wetness and snow wet density. Measurement techniques for both the radar data and ground truth are described. Comparisons between the observations and ground truth are presented and correlated with expectations for backscatter from snow derived from previous measurements of snow at higher angles of depression. For example, dry snow at 95 GHz exhibits sufficient extinction that the material underlying the snow is not observed with as little as 4 cm of snow cover. Comparison of diurnal measurements of the backscatter to simultaneous measurements of snow wetness 2 cm down into the snow pack show very strong hysteresis, indicating the sensitivity of the W-band radar to moisture is confined to a region very close to the top of the snow pack.
Keywords :
backscatter; electromagnetic wave scattering; millimetre wave propagation; moisture; radar polarimetry; remote sensing by radar; snow; 35 GHz; 95 GHz; MMW backscatter; W-band radar; diurnal measurements; extinction; grazing incidence; ground truth; moisture; polarimetric backscatter measurements; radar data; snow pack; snow wetness; Backscatter; Density measurement; Dynamic range; Electromagnetic scattering; Millimeter wave measurements; Millimeter wave radar; Particle scattering; Radar measurements; Radar scattering; Snow;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium, 1999. IEEE
Conference_Location :
Orlando, FL, USA
Print_ISBN :
0-7803-5639-x
Type :
conf
DOI :
10.1109/APS.1999.789070
Filename :
789070
Link To Document :
بازگشت