Title :
Random testability analysis: comparing and evaluating existing approaches
Author :
Camurati, P. ; Prinetto, P. ; Reorda, M. Sonza
Author_Institution :
Dept. of Autom. & Inf., Polytech. of Turin, Italy
Abstract :
The authors present a comparative approach to some testability analysis methods for application to VLSI devices. Using a common framework of implementations and test cases, they compared the results between analysis methods and with those provided by fault simulation or exact calculation where possible. The methods dealt with are the weighted averaging algorithm, COP, the cutting algorithm, Stafan, and Predict
Keywords :
VLSI; automatic testing; fault location; integrated circuit testing; logic testing; COP; Predict; Stafan; VLSI devices; controllability; cutting algorithm; detectability; exact calculation; fault simulation; testability analysis; weighted averaging algorithm; Algorithm design and analysis; Automatic testing; Circuit analysis computing; Circuit faults; Circuit testing; Controllability; Design engineering; Observability; Performance evaluation; Very large scale integration;
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 1988. ICCD '88., Proceedings of the 1988 IEEE International Conference on
Conference_Location :
Rye Brook, NY
Print_ISBN :
0-8186-0872-2
DOI :
10.1109/ICCD.1988.25662
