• DocumentCode
    3437386
  • Title

    LAN-based measurement triggering using LXI instrumentation

  • Author

    Pleasant, Dan

  • Author_Institution
    Agilent Technol., Inc., Santa Rosa, CA
  • fYear
    2005
  • fDate
    26-29 Sept. 2005
  • Firstpage
    44
  • Lastpage
    48
  • Abstract
    The LAN Extensions for Instrumentation (LXI) standard introduces new concepts in signal triggering that have the potential to enable new measurement systems and simplify older ones. This paper presents an overview of the LXI triggering model. LXI triggering includes both hardware and LAN-based signals that can be used together to optimize a measurement application. Like VXI and MMS systems before it, LXI systems utilize a standard backplane; but unlike the older systems, LXI uses the ubiquitous Ethernet LAN standard. Triggers can be broadcast over the LAN to multiple devices simultaneously. In addition, the LXI standard includes an optional LXI trigger bus. From the API level, the triggering model for both LAN and the trigger bus are identical. This paper briefly compares the performance specs of LXI triggering with VXI (VME bus) and MMS (MSIB bus) systems. It explains the different types of triggering that can be obtained using the LAN and the LXI trigger bus. A brief description of the triggering API is given, along with a description of the LXI triggering system architecture. Since the characteristics of LAN triggers differ from traditional hardware triggers, tradeoffs between the two types of triggers are discussed
  • Keywords
    computerised instrumentation; local area networks; measurement standards; peripheral interfaces; API level; Ethernet; LAN; LXI standard; MMS system; MSIB bus; VME bus; VXI system; measurement triggering instrumentation; signal triggering; trigger bus; Backplanes; Delay; Ethernet networks; Hardware; Instruments; Local area networks; Measurement standards; System testing; Test equipment; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Autotestcon, 2005. IEEE
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    0-7803-9101-2
  • Type

    conf

  • DOI
    10.1109/AUTEST.2005.1609099
  • Filename
    1609099