DocumentCode :
3437485
Title :
A Noise Aware CML Latch Modelling for Large System Simulation
Author :
Bhatta, D. ; Bannerjee, S. ; Chatterjee, A.
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
2015
fDate :
3-7 Jan. 2015
Firstpage :
286
Lastpage :
291
Abstract :
Modern high speed communication systems often employ both analog and digital blocks. This poses a challenge for simulation of closed loop system dynamics in presence of non-idealities in any of the analog blocks. Due to the size and complexity of such systems it is not possible to do full system level simulation with circuit level models. The presence of digital control blocks makes it difficult to elevate block level observations to system level performance. A major challenge is the difficulty in estimating the error rate at the output of digital latches (continuous-time to discrete-time domain crossing boundaries) in the presence of noise and non-ideal analog input signals. Simplistic models used currently are often inadequate in capturing the long term effects of non ideal behavior at the block level. In this paper we propose a simulation framework to estimate latch transition probabilities in the response to distorted input and clock waveforms in presence of white noise. The evaluated transition probabilities can then be used to estimate system performance in an event driven Markov chain based model.
Keywords :
Markov processes; clocks; flip-flops; integrated circuit modelling; integrated circuit noise; mixed analogue-digital integrated circuits; Markov chain based model; analog blocks; clock waveforms; closed loop system dynamics; continuous-time domain; digital control blocks; digital latches; discrete-time domain; high speed communication systems; input waveforms; latch transition probabilities; noise aware CML latch modelling; white noise; Clocks; Equations; Integrated circuit modeling; Latches; Load modeling; Mathematical model; Noise; latch modeling; mixed signal simulation; noise modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design (VLSID), 2015 28th International Conference on
Conference_Location :
Bangalore
ISSN :
1063-9667
Type :
conf
DOI :
10.1109/VLSID.2015.55
Filename :
7031748
Link To Document :
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