Expanding LXI class C implementations into low cost applications beyond the "standard" test instrumentation functions

The original concept of the LXI consortium was to provide a LAN standard for classic rack-and-stack and bench top instruments such as DMMs, scopes, waveform generators, etc. as well as for the relatively new and growing field of synthetic instruments. However, there are numerous applications beyond "standard" instrumentation where the standard can be applied with great advantage. This presentation will describe a variety of these applications and detail how the LXI specification relates to, and provides benefits in, these applications. The paper focus is on low cost, measurement related products, their applications and how the LXI spec facilitates their use in both standard test applications as well as other, more niche oriented uses. In particular it will explore how low cost LXI class C products can be utilized in automated test systems, either directly connected to the DUT, or as a monitor of one or more elements of the test systems itself (without direct connection to the DUT). The paper will also consider applications of LXI devices in a wide array of data acquisition applications.