DocumentCode
3437623
Title
Test generation of C-testable array dividers
Author
Wey, Chin-Long ; Chang, Sin-Min
Author_Institution
Dept. of Electr. Eng., Michigan State Univ., East Lansing, MI, USA
fYear
1988
fDate
3-5 Oct 1988
Firstpage
140
Lastpage
144
Abstract
The design of C-testable array dividers that are tested with a test set of constant length irrespective of the circuit size is presented. The results show that the proposed designs of n -by- n nonrestoring and restoring array dividers are C-testable and can be fully tested using only 20 and 40 test patterns, respectively. Algorithms that generate the test patterns and expected outputs are also provided
Keywords
cellular arrays; logic testing; C-testable array dividers; test generation; test patterns; Arithmetic; Circuit faults; Circuit testing; Iterative methods; Labeling; Logic arrays; Logic devices; System testing; Test pattern generators; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Design: VLSI in Computers and Processors, 1988. ICCD '88., Proceedings of the 1988 IEEE International Conference on
Conference_Location
Rye Brook, NY
Print_ISBN
0-8186-0872-2
Type
conf
DOI
10.1109/ICCD.1988.25678
Filename
25678
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