DocumentCode
3437787
Title
DFT Technique for Quick Characterization of Flash Offset in Pipeline ADCs
Author
Nair, P. ; Viswanathan, N.
Author_Institution
Texas Instrum. India Pvt. Ltd., Bangalore, India
fYear
2015
fDate
3-7 Jan. 2015
Firstpage
375
Lastpage
380
Abstract
This paper proposes a novel DFT block and associated method for characterizing the offsets of the coarse flash used in a pipelined ADC. In non-SHA architecture, due to the presence of dynamic offset, measuring flash offsets across input frequency becomes important. By adding special data output modes, the proposed DFT technique allows speedy characterization of flash offset, across PVT, using the standard single-tone test and measurement setup for the ADCs.
Keywords
analogue-digital conversion; discrete Fourier transforms; DFT technique; analog to digital converter; coarse flash; discrete Fourier transforms; flash offset; measurement setup; nonSHA architecture; pipeline ADC; quick characterization; sample and hold amplifier; standard single-tone test; Discrete Fourier transforms; Frequency measurement; Heuristic algorithms; Measurement uncertainty; Pipelines; Redundancy; Standards; Differential Non-Linearity (DNL); Multiplying Digital to Analog Converter (MDAC); Process; Sample and Hold Amplifier (SHA); Voltage and Temperature (PVT);
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design (VLSID), 2015 28th International Conference on
Conference_Location
Bangalore
ISSN
1063-9667
Type
conf
DOI
10.1109/VLSID.2015.69
Filename
7031763
Link To Document