DocumentCode :
3437791
Title :
New data exchange standard for ATE and test information sharing
Author :
Harrison, Ron ; Jain, Anand
Author_Institution :
National Instruments, Austin, TX, USA
fYear :
2005
fDate :
26-29 Sept. 2005
Firstpage :
153
Lastpage :
160
Abstract :
ATML is a cooperative effort by the Naval Air Systems Command (NAVAIR) and members of the ATE industry to define a collection of XML schemas for exchanging ATE and test information in a common format. The scope of these efforts includes defining a series of XML schemas for representing test information, such as test programs and test asset interoperability as well as UUT test data including test results and diagnostics procedures, in a standardized format. This paper goes into more detail on the scope and benefits of such an effort in Mil/Aero and in industry. The paper covers emerging use cases and industry examples and briefly describes the underlying technology. It has also outline how ATML can provide a data exchange standard for not only test results but for test description, station and instrument description as well as interfacing and diagnostics.
Keywords :
XML; automatic test equipment; electronic data interchange; ATE; ATML; automatic test equipment; data exchange standard; instrument description; test description; test information sharing; Aerospace industry; Aerospace testing; Aircraft manufacture; Automatic testing; Defense industry; Field programmable gate arrays; Instruments; Manufacturing; System testing; XML;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Autotestcon, 2005. IEEE
Print_ISBN :
0-7803-9101-2
Type :
conf
DOI :
10.1109/AUTEST.2005.1609118
Filename :
1609118
Link To Document :
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