• DocumentCode
    343780
  • Title

    Antenna gain and scattering measurement using reflective three-antenna method

  • Author

    Hsin-Chia Lu ; Tah-Hsiung Chu

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • Volume
    1
  • fYear
    1999
  • fDate
    11-16 July 1999
  • Firstpage
    374
  • Abstract
    A novel method is proposed to combine the concepts of three-antenna method and RCS measurement method to measure the antenna gain and its structural scattering characteristics without involving the reference antenna or polarimetric calibration. In this method, the measurement arrangement including the transmitting and receiving antennas is considered as a two-port network with reference planes at the input port for each antenna as shown. By connecting three different known terminators at the receiving antenna port and measuring the reflection coefficients at the transmitting antenna port, the scattering parameters of this two-port network can be derived. They are shown to be related to the product of two antennas´ gain. Therefore one can follow the three-antenna method to find the gain of each antenna. In addition, the structural scattering characteristics of each antenna can be solved.
  • Keywords
    S-matrix theory; electromagnetic wave reflection; electromagnetic wave scattering; gain measurement; receiving antennas; transmitting antennas; two-port networks; RCS measurement method; antenna gain measurement; input port; measurement arrangement; receiving antennas; reference planes; reflection coefficients; reflective three-antenna method; scattering measurement; scattering parameters; structural scattering characteristics; terminators; transmitting antennas; two-port network; Antenna measurements; Gain measurement; Impedance measurement; Joining processes; Radar scattering; Receiving antennas; Reflection; Reflector antennas; Scattering parameters; Transmitting antennas;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 1999. IEEE
  • Conference_Location
    Orlando, FL, USA
  • Print_ISBN
    0-7803-5639-x
  • Type

    conf

  • DOI
    10.1109/APS.1999.789157
  • Filename
    789157