Title :
Quasi-free standing GaN epitaxial layer grown on nano-columnar GaN by RF-plasma assisted molecular beam epitaxy
Author :
Kusakabe, Kazuhide ; Yamada, Takayuki ; Toyoura, Yousuke ; Bannai, Ryo ; Kikuchi, Akihiko ; Kishino, Katsumi
Author_Institution :
Dept. of Electr. & Electron. Eng., Sophia Univ., Tokyo, Japan
Abstract :
A new approach for the growth of free standing GaN on sapphire substrates is demonstrated. The self-organized GaN nano-column structure is introduced as a buffer layer of overgrown GaN, which produces the air-bridge-like structure and brings about the relaxed residual strain in the overgrown GaN layers. X-ray investigation reveals that the quasi-free standing 2-3 μm thick Si-doped GaN layers are grown on sapphire substrates by rf-plasma assisted molecular beam epitaxy without the post-growth process and/or the regrowth procedure. Overgrown GaN peeled from GaN nano-column is observed due to a simple mechanical process
Keywords :
III-V semiconductors; X-ray diffraction; gallium compounds; molecular beam epitaxial growth; nanostructured materials; semiconductor epitaxial layers; semiconductor growth; wide band gap semiconductors; 2 to 3 mum; GaN; GaN:Si layers; RF-plasma assisted molecular beam epitaxy; air-bridge-like structure; buffer layer; nano-columnar GaN; quasi-free standing GaN epitaxial layer; relaxed residual strain; Buffer layers; Capacitive sensors; Epitaxial layers; Gallium nitride; Molecular beam epitaxial growth; Nanostructures; Optical buffering; Optical films; Substrates; Thermal expansion;
Conference_Titel :
Compound Semiconductors, 2000 IEEE International Symposium on
Conference_Location :
Monterey, CA
Print_ISBN :
0-7803-6258-6
DOI :
10.1109/ISCS.2000.947201