• DocumentCode
    3437935
  • Title

    Robust stability properties of the υ-gap metric for time-varying systems

  • Author

    Khong, Sei Zhen ; Cantoni, Michael ; Jönsson, Ulf T.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Univ. of Melbourne, Melbourne, VIC, Australia
  • fYear
    2011
  • fDate
    12-15 Dec. 2011
  • Firstpage
    2028
  • Lastpage
    2033
  • Abstract
    The stability of uncertain feedback interconnections of causal time-varying linear systems is studied in terms of a recently established generalisation of the v-gap metric. In particular, a number of robustness results from the well-known linear time-invariant theory are extended. The time-varying generalisations include: sufficient conditions for robust stability; a bound on robust performance; and two-sided bounds on the induced norm of the variation in a closed-loop mapping as an open-loop component of the feedback interconnection is perturbed. Underlying assumptions are verified for causal systems that exhibit linear periodically time-varying behaviour. This includes a class of sampled-data systems as a special case. Within the periodic context considered, it can be shown that a robust stability condition is also necessary.
  • Keywords
    causality; closed loop systems; feedback; interconnected systems; linear systems; open loop systems; robust control; sampled data systems; time-varying systems; uncertain systems; causal time-varying linear system; closed-loop mapping; linear periodically time-varying behaviour; open-loop component; robust performance; robust stability property; sampled data system; time-varying generalisation; two-sided bounds; uncertain feedback interconnection stability; v-gap metric; Measurement; Robust stability; Robustness; Stability analysis; Time varying systems; Topology; Transfer functions; υ-gap metric; Feedback; periodic systems; robust stability; time-varying systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Decision and Control and European Control Conference (CDC-ECC), 2011 50th IEEE Conference on
  • Conference_Location
    Orlando, FL
  • ISSN
    0743-1546
  • Print_ISBN
    978-1-61284-800-6
  • Electronic_ISBN
    0743-1546
  • Type

    conf

  • DOI
    10.1109/CDC.2011.6161042
  • Filename
    6161042