Title :
Challenges of testing high-volume, low-cost 8-bit microcontrollers
Author :
Stout, Matthew ; Tumin, Ken ; Vargas, Carmen ; Gotchall, Bob
Author_Institution :
8/16-Bit Products Div., Motorola Inc., Austin, TX, USA
fDate :
30 March-4 April 2003
Abstract :
This paper compares the development and effectiveness of scan-based testing and functional testing using two microcontroller studies. This design-for-test methodology has been shown to reliably produce high quality products. This approach also provides a diagnostic failure analysis methodology that can greatly improve detection of quality and reliability failures.
Keywords :
boundary scan testing; design for testability; failure analysis; integrated circuit reliability; integrated circuit testing; microcontrollers; 8 bit; design-for-test methodology; diagnostic failure analysis methodology; functional testing; high quality products; high-volume low-cost 8-bit microcontroller testing; quality failures; reliability failures; scan-based testing; Automatic testing; Circuit testing; Costs; Design for testability; Failure analysis; Flip-flops; Integrated circuit reliability; Integrated circuit testing; Microcontrollers; Production;
Conference_Titel :
Reliability Physics Symposium Proceedings, 2003. 41st Annual. 2003 IEEE International
Print_ISBN :
0-7803-7649-8
DOI :
10.1109/RELPHY.2003.1197775
