DocumentCode
3438145
Title
Challenges of testing high-volume, low-cost 8-bit microcontrollers
Author
Stout, Matthew ; Tumin, Ken ; Vargas, Carmen ; Gotchall, Bob
Author_Institution
8/16-Bit Products Div., Motorola Inc., Austin, TX, USA
fYear
2003
fDate
30 March-4 April 2003
Firstpage
366
Lastpage
371
Abstract
This paper compares the development and effectiveness of scan-based testing and functional testing using two microcontroller studies. This design-for-test methodology has been shown to reliably produce high quality products. This approach also provides a diagnostic failure analysis methodology that can greatly improve detection of quality and reliability failures.
Keywords
boundary scan testing; design for testability; failure analysis; integrated circuit reliability; integrated circuit testing; microcontrollers; 8 bit; design-for-test methodology; diagnostic failure analysis methodology; functional testing; high quality products; high-volume low-cost 8-bit microcontroller testing; quality failures; reliability failures; scan-based testing; Automatic testing; Circuit testing; Costs; Design for testability; Failure analysis; Flip-flops; Integrated circuit reliability; Integrated circuit testing; Microcontrollers; Production;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium Proceedings, 2003. 41st Annual. 2003 IEEE International
Print_ISBN
0-7803-7649-8
Type
conf
DOI
10.1109/RELPHY.2003.1197775
Filename
1197775
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