• DocumentCode
    3438146
  • Title

    Design considerations for a distributed test system

  • Author

    Peng, Faya

  • Author_Institution
    Nat. Instruments, Austin, TX, USA
  • fYear
    2005
  • fDate
    26-29 Sept. 2005
  • Firstpage
    235
  • Lastpage
    239
  • Abstract
    Developers deploy distributed test systems for a variety of reasons. Distributed systems allow users to meet space and geographic constraints as well as distribute processing across multiple nodes. When designing a distributed test system, developers should consider many factors to create a system that best suits their needs. Some of the key considerations include measurement functionality provided by the instruments, instrumentation bus capabilities, locality, and distribution. To manage these considerations, a user might meet system needs by interconnecting multiple bus platforms to create a hybrid test system. Connecting multiple buses in a distributed system can seem daunting and overwhelming. With the proper tools, however, a developer can architect a distributed system to meet constraints like measurement, timing, space, and geographic needs and benefit from increased computing power. Using a layered test architecture with an integrated software framework is key to easily and successfully combining various buses into one system. With a hybrid test system, developers can extend the longevity of their systems by maximizing their investment in hardware and software while still integrating newer technologies into the system.
  • Keywords
    computerised instrumentation; integrated software; measurement systems; distributed test system; hybrid test system; instrumentation bus capability; integrated software framework; layered test architecture; measurement functionality; multiple bus platform; Computer architecture; Distributed computing; Extraterrestrial measurements; Instruments; Joining processes; Power measurement; Power system interconnection; Software testing; System testing; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Autotestcon, 2005. IEEE
  • Print_ISBN
    0-7803-9101-2
  • Type

    conf

  • DOI
    10.1109/AUTEST.2005.1609136
  • Filename
    1609136