Enhancement of the multi-module memory bus for signal integrity by using genetic algorithm

Author

Chun-Te Wu ; Ding-Bing Lin

Author_Institution

Dayeh Univ., Zhanghua, Taiwan

fYear

2012

fDate

9-11 Dec. 2012

Firstpage

157

Lastpage

160

Abstract

The purpose of this paper is to optimize the multi-module memory bus by using genetic algorithm. In this paper, the experiment results on lossless transmission line are presented to define a fitness function by using the formula of reflection and transmission coefficients. The goal of reflection coefficient is zero and transmission coefficient is one. Therefore, the receiver can receive the largest power. This scheme is applied to solve the impedance mismatching problem for the structure of DIMMs.

Keywords

DRAM chips; SRAM chips; circuit optimisation; genetic algorithms; DDR3 SDRAM; DIMM structure; dual in-line memory module; fitness function; genetic algorithm; impedance mismatching problem; lossless transmission line; multimodule memory bus enhancement; receiver; reflection coefficients; signal integrity; transmission coefficients; Central Processing Unit; Equivalent circuits; Genetic algorithms; Packaging; Resistance; SDRAM; Simulation; dual in-line memory module (DIMM); genetic algorithm (GA); multi-module memory bus;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Design of Advanced Packaging and Systems Symposium (EDAPS), 2012 IEEE

Conference_Location

Taipei

Print_ISBN

978-1-4673-1444-2

Electronic_ISBN

978-1-4673-1445-9

Type

conf

DOI

10.1109/EDAPS.2012.6469438

Filename

6469438