Title :
Enhancement of the multi-module memory bus for signal integrity by using genetic algorithm
Author :
Chun-Te Wu ; Ding-Bing Lin
Author_Institution :
Dayeh Univ., Zhanghua, Taiwan
Abstract :
The purpose of this paper is to optimize the multi-module memory bus by using genetic algorithm. In this paper, the experiment results on lossless transmission line are presented to define a fitness function by using the formula of reflection and transmission coefficients. The goal of reflection coefficient is zero and transmission coefficient is one. Therefore, the receiver can receive the largest power. This scheme is applied to solve the impedance mismatching problem for the structure of DIMMs.
Keywords :
DRAM chips; SRAM chips; circuit optimisation; genetic algorithms; DDR3 SDRAM; DIMM structure; dual in-line memory module; fitness function; genetic algorithm; impedance mismatching problem; lossless transmission line; multimodule memory bus enhancement; receiver; reflection coefficients; signal integrity; transmission coefficients; Central Processing Unit; Equivalent circuits; Genetic algorithms; Packaging; Resistance; SDRAM; Simulation; dual in-line memory module (DIMM); genetic algorithm (GA); multi-module memory bus;
Conference_Titel :
Electrical Design of Advanced Packaging and Systems Symposium (EDAPS), 2012 IEEE
Conference_Location :
Taipei
Print_ISBN :
978-1-4673-1444-2
Electronic_ISBN :
978-1-4673-1445-9
DOI :
10.1109/EDAPS.2012.6469438