Title :
Critic: a knowledge-based program for critiquing circuit designs
Author :
Spickelmier, Rick L. ; Newton, A. Richard
Author_Institution :
Electron. Res. Lab., California Univ., Berkeley, CA, USA
Abstract :
Critic is a knowledge-based system that looks for errors or `bad design style´ in circuit designs. Critic takes as input a description of a circuit and a knowledge-base that describes a particular design-style and technology. The knowledge base consists of: process and design-style constants, a set of primitive descriptions, a set of structure descriptions, and error-checking rules. Critic uses the information in the knowledge base to find structures and errors in the circuit. The errors can range from easily recognizable errors such as a transistor bulk being connected to the wrong supply or a static gate having nonequal rise and fall times to hard-to-recognize errors, such as those dealing with charge sharing, timing, and testability. Critic is integrated with the Berkeley CAD system, has an interactive graphical input and feedback, is easy to use, and has a firm separation between the knowledge-base and program internals
Keywords :
circuit CAD; knowledge based systems; programming environments; software tools; Berkeley CAD system; Critic; charge sharing; design-style constants; error-checking rules; knowledge-based program; knowledge-based system; structure descriptions; testability; timing; Capacitance; Circuit synthesis; Circuit testing; Clocks; Graphics; Knowledge based systems; Laboratories; Process design; RLC circuits; Timing;
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 1988. ICCD '88., Proceedings of the 1988 IEEE International Conference on
Conference_Location :
Rye Brook, NY
Print_ISBN :
0-8186-0872-2
DOI :
10.1109/ICCD.1988.25715