Notice of RetractionAccelerated reliability growth test under multiple environment stresses

Notice of Retraction

After careful and considered review of the content of this paper by a duly constituted expert committee, this paper has been found to be in violation of IEEE´s Publication Principles.

We hereby retract the content of this paper. Reasonable effort should be made to remove all past references to this paper.

The presenting author of this paper has the option to appeal this decision by contacting TPII@ieee.org.

Single-stress accelerated reliability growth test is restricted as the limited improvement of a stress. In order to further shorten the lead time of a product, on the basis of the single-stress accelerated reliability growth test, we developed a double-stress accelerated reliability growth model based on AMSAA-BISE growth model and generalized Egring accelerated model. We presented the test program design based on the uniform theory. Then propose parameter estimation method respectively based on the maximum likelihood estimation for reliability growth model and the least squares estimation for the accelerated life model. Finally, specific example is given to verify the correctness of the model. Through comparison of the estimated and simulated value of the life character, it can be concluded that the multiple-stress accelerated reliability growth model proposed in this paper is correct and feasible.