Title :
Research of the noise spectra in the mm-wave electrovacuum devices
Author :
Koshpar´onok, V.N. ; Maystrenko, Y.V.
Author_Institution :
A. Usikov Inst. for Radiophys. & Electron., Acad. of Sci., Ukraine
Abstract :
In millimeter-wave backward-wave oscillators (BWO) and diffraction oscillators (DRO), the frequency instability near the carrier is stipulated by additive noise and modulation noises. In this paper, a model of the fluctuation spectrum of high-frequency oscillation BWOs and DROs near the carrier frequency was constructed. This model allows estimation of the qualitative influence of exterior additive and multiplicate noises on the oscillation frequency of resonant generators in the millimeter wave range and leads to extrapolation of experimental curves in a range of frequencies ωα<20 Hz. Further refining of the model together with experimental measurements of the natural and technical linewidth of oscillations of sectional generators will allow determination of fundamental flicker-noise components of the radiation
Keywords :
acoustic noise; backward wave oscillators; dielectric resonator oscillators; fluctuations; frequency stability; millimetre wave oscillators; 20 Hz; BWO; DRO; additive noise; carrier frequency; exterior additive noise; extrapolation; fluctuation spectrum model; frequency instability; fundamental flicker-noise components; high-frequency oscillation; millimeter wave range; millimeter-wave backward-wave oscillators; millimeter-wave diffraction oscillators; mm-wave electrovacuum devices; modulation noise; multiplicate noise; natural linewidth; noise spectra; oscillation frequency; resonant generators; sectional generators; Additive noise; Diffraction; Extrapolation; Fluctuations; Frequency estimation; Millimeter wave measurements; Noise generators; Oscillators; Resonance; Resonant frequency;
Conference_Titel :
Physics and Engineering of Millimeter and Sub-Millimeter Waves, 2001. The Fourth International Kharkov Symposium on
Conference_Location :
Kharkov
Print_ISBN :
0-7803-6473-2
DOI :
10.1109/MSMW.2001.947231
