Title :
High-linearity calibration of low-resolution digital-to-analog converters
Author :
Goes, J. ; Franca, J. ; Paulino, N. ; Grilo, J. ; Temes, G.
Author_Institution :
Integrated Circuits & Syst. Group, Inst. Superior Tecnico, Lisbon, Portugal
fDate :
30 May-2 Jun 1994
Abstract :
We describe a high-precision calibrating system where the code error voltages of a low-resolution binary-weighted capacitor-array DAC, measured against the precise code voltage references generated by a single-capacitor pulse-counting DAC, are digitized and corrected using a small subbinary-weighted capacitor-array. Computer simulation results are given to demonstrate the operation of the proposed system and the benefits that can be gained by employing gain- and offset-compensated stages
Keywords :
calibration; digital-analogue conversion; error correction codes; binary-weighted capacitor-array DAC; code error voltages; code voltage references; gain-compensated stages; high-linearity calibration; low-resolution digital-to-analog converters; offset-compensated stages; single-capacitor pulse-counting DAC; subbinary-weighted capacitor-array; Calibration; Capacitors; Computer architecture; Digital-analog conversion; Error correction codes; Linearity; Pulse amplifiers; Pulse generation; Pulse measurements; Voltage;
Conference_Titel :
Circuits and Systems, 1994. ISCAS '94., 1994 IEEE International Symposium on
Conference_Location :
London
Print_ISBN :
0-7803-1915-X
DOI :
10.1109/ISCAS.1994.409378
