Title :
Effects of operating conditions on DMD hinge memory lifetime
Author :
Sontheimer, A.B. ; Mehrl, D.J.
Author_Institution :
Texas Instrum. Inc., Plano, TX, USA
fDate :
30 March-4 April 2003
Abstract :
This paper will show how different operating conditions improve the hinge memory lifetime of the Digital Micromirror Device (DMD). The correlation of parametric measurements to physical properties will also be developed. Specific operating conditions explored include the effects of (1) on/off duty cycle, (2) relaxation during nonoperation and (3) reversibility on hinge memory lifetime performance.
Keywords :
failure analysis; life testing; micromirrors; optical testing; semiconductor device reliability; semiconductor device testing; DMD hinge memory lifetime; Digital Micromirror Device; failure mechanisms; on/off duty cycle; operating conditions; parametric measurements; physical properties; relaxation; reversibility; Displays; Fasteners; Instruments; Life estimation; Lifetime estimation; Materials testing; Mirrors; Predictive models; Temperature; Voltage;
Conference_Titel :
Reliability Physics Symposium Proceedings, 2003. 41st Annual. 2003 IEEE International
Print_ISBN :
0-7803-7649-8
DOI :
10.1109/RELPHY.2003.1197794
