DocumentCode
3438496
Title
Effects of operating conditions on DMD hinge memory lifetime
Author
Sontheimer, A.B. ; Mehrl, D.J.
Author_Institution
Texas Instrum. Inc., Plano, TX, USA
fYear
2003
fDate
30 March-4 April 2003
Firstpage
473
Lastpage
477
Abstract
This paper will show how different operating conditions improve the hinge memory lifetime of the Digital Micromirror Device (DMD). The correlation of parametric measurements to physical properties will also be developed. Specific operating conditions explored include the effects of (1) on/off duty cycle, (2) relaxation during nonoperation and (3) reversibility on hinge memory lifetime performance.
Keywords
failure analysis; life testing; micromirrors; optical testing; semiconductor device reliability; semiconductor device testing; DMD hinge memory lifetime; Digital Micromirror Device; failure mechanisms; on/off duty cycle; operating conditions; parametric measurements; physical properties; relaxation; reversibility; Displays; Fasteners; Instruments; Life estimation; Lifetime estimation; Materials testing; Mirrors; Predictive models; Temperature; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium Proceedings, 2003. 41st Annual. 2003 IEEE International
Print_ISBN
0-7803-7649-8
Type
conf
DOI
10.1109/RELPHY.2003.1197794
Filename
1197794
Link To Document