Title :
Multiplicative window generators of pseudo-random test vectors
Author :
Rajski, Janusz ; Tyszer, Jerzy
Author_Institution :
Mentor Graphics Corp., Wilsonville, OR, USA
Abstract :
New arithmetic two-dimensional generators of pseudo-random test vectors are presented. As an integral part of a recently proposed arithmetic built-in self test (ABIST) environment, all generation functions are executed by basic building blocks performing regular functions of data path architectures, yet the scheme is compatible with scan, parallel scan, partial scan and boundary scan designs. The need for extra hardware is either entirely eliminated or drastically reduced, test vectors can be easily distributed to different modules of the system, and there is virtually no performance degradation
Keywords :
application specific integrated circuits; automatic testing; built-in self test; integrated circuit testing; logic testing; ABIST; ASICs; arithmetic built-in self test; arithmetic two-dimensional generators; data path architectures; generation functions; multiplicative window generators; pseudo-random test vectors; test vectors; Arithmetic; Automatic testing; Built-in self-test; Circuit testing; Degradation; Delay; Hardware; Logic testing; Performance evaluation; System testing;
Conference_Titel :
European Design and Test Conference, 1996. ED&TC 96. Proceedings
Conference_Location :
Paris
Print_ISBN :
0-8186-7424-5
DOI :
10.1109/EDTC.1996.494126
