The effect of metal foil tape degradation on the long-term reliability of PV modules

Author

Sorensen, N. Robert ; Quintana, Michael A. ; Puskar, Joseph D. ; Lucero, Samuel J.

Author_Institution

Sandia Nat. Labs., Albuquerque, NM, USA

fYear

2009

fDate

7-12 June 2009

Abstract

A program is underway at Sandia National Laboratories to predict long-term reliability of photovoltaic systems. The vehicle for the reliability predictions is a Reliability Block Diagram (RBD), which models system behavior. Because this model is based mainly on field failure and repair times, it cannot currently be used to accurately predict end-of-life. In order to be truly predictive, physics-informed degradation processes and failure mechanisms need to be included in the model. This paper describes accelerated life testing of metal foil tapes used in thin-film PV modules, and how tape joint degradation, a possible failure mode, can be incorporated into the model.

Keywords

failure analysis; foils; life testing; modules; photovoltaic cells; reliability; thin film devices; accelerated life testing; failure mechanisms; long-term reliability; metal foil tape degradation; photovoltaic systems; reliability block diagram; thin-film PV modules; Degradation; Failure analysis; Laboratories; Life estimation; Life testing; Photovoltaic systems; Predictive models; Qualifications; Solar power generation; Transistors;

fLanguage

English

Publisher

ieee

Conference_Titel

Photovoltaic Specialists Conference (PVSC), 2009 34th IEEE

Conference_Location

Philadelphia, PA

ISSN

0160-8371

Print_ISBN

978-1-4244-2949-3

Electronic_ISBN

0160-8371

Type

conf

DOI

10.1109/PVSC.2009.5411140

Filename

5411140