The analysis of abnormal conditions for a type of 10-bit D/A converter

Failure analysis of electronic components is becoming more and more important in recent years. Converters often fail after a period of storage, e.g. the failure mode of 782# caused by parameter changes in integral nonlinearity and differential nonlinearity. This paper analyzes an abnormal condition of a 10-bit D/A converter and introduces an effective analysis process to this mode. First, ESD reason can be eliminated by means of ESD test because I/V curves of the test circuits are different from the failed product. Then, the real reason of the 782# mode was found by analyzing the layout and the craft deviation. Experimental results from simulation and test show that the failure mode caused by layout defects can be detected by the proposed method.