DocumentCode :
343866
Title :
Near field distributions in radial line slot antennas for surface wave coupled plasma generation
Author :
Yamamoto, T. ; Ono, H. ; Ando, M. ; Goto, N. ; Ishii, N.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Yamagata Univ., Yonezawa, Japan
Volume :
2
fYear :
1999
fDate :
11-16 July 1999
Firstpage :
986
Abstract :
The near field distributions in radial line slot antennas (RLSA) for surface wave coupled plasma (SWP) are examined. The RLSA are suitable for uniform, high density and large-area plasma generation. In order to realize higher productivity, quick evacuation of reaction gas a narrow gap process space is highly required. Since a wafer is placed close to the antenna aperture in this case, the evaluation of the electromagnetic near-fields in the RLSA for the plasma process is effective and indispensable. Plasma distribution control by changing the slot pattern is also possible based upon the information of the near field distributions. A novel slot pattern, which has many transverse slots, is fabricated and tested. The exponential attenuation of the fields in the boresight direction is measured and the interesting and remarkable characteristics of the novel RLSA for SWP process are confirmed.
Keywords :
antenna radiation patterns; antennas in plasma; electromagnetic fields; plasma production; slot antenna arrays; antenna aperture; boresight direction; electromagnetic near-fields; exponential attenuation; large-area plasma generation; near field distributions; plasma distribution control; plasma process; radial line slot antennas; reaction gas evacuation; slot pattern; surface wave coupled plasma generation; transverse slots; uniform plasma generation; wafer; Aperture antennas; Couplings; Plasma density; Plasma measurements; Plasma properties; Plasma waves; Productivity; Slot antennas; Surface waves; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium, 1999. IEEE
Conference_Location :
Orlando, FL, USA
Print_ISBN :
0-7803-5639-x
Type :
conf
DOI :
10.1109/APS.1999.789478
Filename :
789478
Link To Document :
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