Automated PICA transistor channeling and spatial-temporal photon correlation for faster IC diagnosis

Author

Desplats, Romain ; Beaudoin, Felix ; Faggion, Gael ; Jesson, Olivier ; Perdu, Philippe ; Leibowitz, Marty ; Lundquist, Ted ; Shah, Ketan

Author_Institution

French Space Agency, CNES, Toulouse, France

fYear

2003

fDate

30 March-4 April 2003

Firstpage

545

Lastpage

552

Abstract

Debug of the latest ICs may be tackled with PICA (Picosecond Imaging Circuit Analysis). However, the acquisition time can be long even taking several hour;. We have developed a novel approach called auto-channeling, based on the known physics of hot carrier induced photon emission which makes it possible to obtain results in minutes.

Keywords

CMOS integrated circuits; MOSFET; channelling; electroluminescence; failure analysis; hot carriers; integrated circuit testing; photon correlation spectroscopy; semiconductor device testing; spatiotemporal phenomena; 0.1 micron; CMOS transistors; IC debug; IC diagnosis; acquisition time; auto-channeling; automated PICA transistor channeling; failure analysis; faint light emission; hot carrier induced photon emission; picosecond imaging circuit analysis; spatial-temporal photon correlation; Circuit testing; Detectors; Energy states; Event detection; Hot carriers; Photonic band gap; Photonic integrated circuits; Physics; Silicon; Timing;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability Physics Symposium Proceedings, 2003. 41st Annual. 2003 IEEE International

Print_ISBN

0-7803-7649-8

Type

conf

DOI

10.1109/RELPHY.2003.1197806

Filename

1197806