Title :
Automated PICA transistor channeling and spatial-temporal photon correlation for faster IC diagnosis
Author :
Desplats, Romain ; Beaudoin, Felix ; Faggion, Gael ; Jesson, Olivier ; Perdu, Philippe ; Leibowitz, Marty ; Lundquist, Ted ; Shah, Ketan
Author_Institution :
French Space Agency, CNES, Toulouse, France
fDate :
30 March-4 April 2003
Abstract :
Debug of the latest ICs may be tackled with PICA (Picosecond Imaging Circuit Analysis). However, the acquisition time can be long even taking several hour;. We have developed a novel approach called auto-channeling, based on the known physics of hot carrier induced photon emission which makes it possible to obtain results in minutes.
Keywords :
CMOS integrated circuits; MOSFET; channelling; electroluminescence; failure analysis; hot carriers; integrated circuit testing; photon correlation spectroscopy; semiconductor device testing; spatiotemporal phenomena; 0.1 micron; CMOS transistors; IC debug; IC diagnosis; acquisition time; auto-channeling; automated PICA transistor channeling; failure analysis; faint light emission; hot carrier induced photon emission; picosecond imaging circuit analysis; spatial-temporal photon correlation; Circuit testing; Detectors; Energy states; Event detection; Hot carriers; Photonic band gap; Photonic integrated circuits; Physics; Silicon; Timing;
Conference_Titel :
Reliability Physics Symposium Proceedings, 2003. 41st Annual. 2003 IEEE International
Print_ISBN :
0-7803-7649-8
DOI :
10.1109/RELPHY.2003.1197806
