DocumentCode
3438839
Title
Timing driven placement reconfiguration for fault tolerance and yield enhancement in FPGAs
Author
Mathur, Anmol ; Liu, C.L.
Author_Institution
Dept. of Comput. Sci., Illinois Univ., Urbana, IL, USA
fYear
1996
fDate
11-14 Mar 1996
Firstpage
165
Lastpage
169
Abstract
The architectural regularity of FPGAs provides an inherent redundancy which can be exploited for fault tolerance and yield enhancement. In this paper we examine the problem of reconfiguring the placement of a circuit on an FPGA to tolerate a given fault pattern in the array of CLBs. The primary objective of the placement reconfiguration is to minimize timing degradation. The concept of a slack neighborhood graph is used as a general tool for timing driven reconfiguration with a low increase in critical path delay. Our algorithm simultaneously achieves both provably low timing degradation and low re-programming cost. For a wide range of fault probabilities and circuits our algorithm successfully reconfigures the placement with less than 1% degradation in the circuit delay
Keywords
circuit layout CAD; field programmable gate arrays; integrated circuit layout; integrated circuit reliability; logic CAD; network routing; redundancy; timing; FPGAs; critical path delay; fault tolerance; slack neighborhood graph; timing degradation; timing driven placement reconfiguration; yield enhancement; Circuit faults; Degradation; Delay; Fault tolerance; Field programmable gate arrays; Logic circuits; Programmable logic arrays; Reconfigurable logic; Routing; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
European Design and Test Conference, 1996. ED&TC 96. Proceedings
Conference_Location
Paris
ISSN
1066-1409
Print_ISBN
0-8186-7424-5
Type
conf
DOI
10.1109/EDTC.1996.494143
Filename
494143
Link To Document