• DocumentCode
    3438921
  • Title

    Advanced microelectronics test facility at New Mexico Tech

  • Author

    Bracht, Stephen M. ; Teare, Scott W. ; Meason, John L. ; Quarrie, Lindsay O.

  • Author_Institution
    Dept. of Electr. Eng., New Mexico Tech., Socorro, NM
  • fYear
    2005
  • fDate
    26-29 Sept. 2005
  • Firstpage
    439
  • Lastpage
    443
  • Abstract
    Military systems are remaining in-service and in active use far beyond their designed operational lifetime. This extended service is leading to a shortage of replacement components for these systems as many of the parts are now obsolete. When combined with the move from MIL-Spec to commercial-off-the-shelf components the need for an advanced testing facility to qualify the replacement components to meet electrical, environmental, and radiological performance standards has dramatically increased. The advanced microelectronics laboratory at New Mexico Tech has been designed to support both the need for qualifying military system components as well as commercial components for use in satellites, space platforms, and high altitude aircraft that are subject to radiation interactions. In this paper we demonstrate some of the capabilities of the facility applied to commonly used microelectronic devices
  • Keywords
    military avionics; military systems; test facilities; MIL-Spec; commercial-off-the-shelf components; microelectronic devices; microelectronics test facility; military system components; replacement components; Algorithm design and analysis; Automatic testing; Electronic equipment testing; Life testing; Logic testing; Materials testing; Microelectronics; Performance evaluation; Semiconductor device testing; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Autotestcon, 2005. IEEE
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    0-7803-9101-2
  • Type

    conf

  • DOI
    10.1109/AUTEST.2005.1609176
  • Filename
    1609176