The reliability of the process of lifetest of the Aerospace Photoconductive Infrared Detector

This paper analyzes the mechanism of low pressure discharge probably occured in the process of Aerospace Photoconductive Infrared Detector life test. It is verified that low pressure discharge can take place in the equipment of life test. Under the condition of the sudden heavy leakage of gas sealed in the detector the low pressure condition in the vacuum chamber appears. Accompanied with the leakage of high electric field to the chamber, the low pressure discharge happens. The large current resulting from the discharge destroyed the detector. This paper also provides a method for preventing from the discharge. A shielding net is added to the flange of the ion pump. Experiments indicate that this method can effectively put an end to the happening of low pressure discharge.